Resolution and resolvability in one, two and three dimensions
Research article: Resolution and resolvability in one, two and three dimensions
Authors: G.M. Gasimova1,2*, R.C. Masmaliyeva1**, G.N. Murshudov1,3***
1Institute of Molecular Biology & Biotechnologies, Azerbaijan National Academy of Sciences, Azerbaijan
2Azerbaijan State Oil and Industry University, 34 Azadliq ave., Baku AZ1010, Azerbaijan
3MRC Laboratory of Molecular Biology, Cambridge, UK
* For correspondence: GXG557@alumni.bham.ac.uk
** For correspondence: r.masmaliyeva@gmail.com
***For correspondence: garib@mrc-lmb.cam.ac.uk
Accepted for publication: 10 August 2019
Abstract:
This contribution describes an approach to the problem of resolution and resolvability in scattering methods (e.g. X-ray diffraction, electron microscopy) in the presence of series termination and blurring. One-, two- and three-dimensional cases are considered separately. Formulas relating the effects of nominal resolution and blurring to peak resolvability are derived and analysed. We show that both blurring and series termination widen point source peaks thus reducing their resolvability.
Keywords: Refinement, electron cryo-microscopy, Fourier shell correlation, Fourier transformation, Gaussian distribution
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